JANUARY 31 2003
Table 4-1. Close-Interval Survey CP System Component Testing Requirements
CP SYSTEM TYPE
a) One anode-to-soil potential measurement with the reference
electrode placed over the anode, and the anode lead
SYSTEMS (at each test
b) Anode-to-structure current using (in order of preference) a
clamp-on milliammeter, a multimeter measuring millivolts across a
calibrated shunt, or a multimeter connected in series measuring
IMPRESSED CURRENT a) Perform the rectifier operational checkout (para 4-5).
b) Calculate the rectifier efficiency by dividing the calculated output
DC power by the factored input AC power.
c) Perform the impressed current anode bed survey (para 4-6).